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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

Name: Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach
ISBN: 9780863417450

Y. Sun, Yichuang Sun

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This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.

Категории:

Engineering

Год:

2007

Издательство:

IET

Язык:

english

Страницы:

411

ISBN 10:

0863417450